Human‑made electromagnetic fields: Ion forced‑oscillation and voltage‑gated ion channel dysfunction, oxidative stress and DNA damage (Review)

Abstract

Human-made electromagnetic fields: Ion forced-oscillation and voltage-gated ion channel dysfunction, oxidative stress and DNA damage (Review) Dimitris J Panagopoulos, Andreas Karabarbounis, Igor Yakymenko, George P Chrousos. Human-made electromagnetic fields: Ion forced-oscillation and voltage-gated ion channel dysfunction, oxidative stress and DNA damage (Review). Int J Oncol. 2021 Nov;59(5):92. doi: 10.3892/ijo.2021.5272. Abstract Exposure of animals/biological samples to human-made electromagnetic fields (EMFs), especially in the extremely low frequency (ELF) band, and the microwave/radio frequency (RF) band which is always combined with ELF, may lead to DNA damage. DNA damage is connected with cell death, infertility and other pathologies, including cancer. ELF exposure from high-voltage power lines and complex RF exposure from wireless communication antennas/devices are linked to increased cancer risk. Almost all human-made RF EMFs include ELF components in the form of modulation, pulsing and random variability. Thus, in addition to polarization and coherence, the existence of ELFs is a common feature of almost all human-made EMFs. The present study reviews the DNA damage and related effects induced by human-made EMFs. The ion forced-oscillation mechanism for irregular gating of voltage-gated ion channels on cell membranes by polarized/coherent EMFs is extensively described. Dysfunction of ion channels disrupts intracellular ionic concentrations, which determine the cell's electrochemical balance and homeostasis. The present study shows how this can result in DNA damage through reactive oxygen species/free radical overproduction. Thus, a complete picture is provided of how human-made EMF exposure may indeed lead to DNA damage and related pathologies, including cancer. Moreover, it is suggested that the non-thermal biological effects attributed to RF EMFs are actually due to their ELF components. Open access paper: spandidos-publications.com

AI evidence extraction

Main findings

This review states that exposure to human-made EMFs (especially ELF and RF/microwave bands, with RF described as including ELF components) may lead to DNA damage and related pathologies. It describes an ion forced-oscillation mechanism whereby polarized/coherent EMFs may cause irregular gating of voltage-gated ion channels, disrupting ionic homeostasis and leading to reactive oxygen species overproduction and DNA damage; it also suggests non-thermal RF effects are due to ELF components.

Outcomes measured

• DNA damage
• oxidative stress (reactive oxygen species/free radical overproduction)
• voltage-gated ion channel dysfunction/irregular gating
• cell death
• infertility
• cancer risk/pathologies

Suggested hubs

• occupational-exposure (0.25)
  Mentions ELF exposure from high-voltage power lines (a common occupational/community source), but no specific occupational cohort is described.

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    "study_type": "review",
    "exposure": {
        "band": "ELF and RF/microwave (RF described as combined with ELF components via modulation/pulsing)",
        "source": "high-voltage power lines; wireless communication antennas/devices",
        "frequency_mhz": null,
        "sar_wkg": null,
        "duration": null
    },
    "population": "animals/biological samples (general; also discusses human cancer risk links)",
    "sample_size": null,
    "outcomes": [
        "DNA damage",
        "oxidative stress (reactive oxygen species/free radical overproduction)",
        "voltage-gated ion channel dysfunction/irregular gating",
        "cell death",
        "infertility",
        "cancer risk/pathologies"
    ],
    "main_findings": "This review states that exposure to human-made EMFs (especially ELF and RF/microwave bands, with RF described as including ELF components) may lead to DNA damage and related pathologies. It describes an ion forced-oscillation mechanism whereby polarized/coherent EMFs may cause irregular gating of voltage-gated ion channels, disrupting ionic homeostasis and leading to reactive oxygen species overproduction and DNA damage; it also suggests non-thermal RF effects are due to ELF components.",
    "effect_direction": "harm",
    "limitations": [],
    "evidence_strength": "insufficient",
    "confidence": 0.7399999999999999911182158029987476766109466552734375,
    "peer_reviewed_likely": "yes",
    "keywords": [
        "electromagnetic fields",
        "ELF",
        "RF",
        "microwave",
        "DNA damage",
        "oxidative stress",
        "reactive oxygen species",
        "voltage-gated ion channels",
        "ion forced-oscillation",
        "non-thermal effects",
        "cancer risk",
        "power lines",
        "wireless communication"
    ],
    "suggested_hubs": [
        {
            "slug": "occupational-exposure",
            "weight": 0.25,
            "reason": "Mentions ELF exposure from high-voltage power lines (a common occupational/community source), but no specific occupational cohort is described."
        }
    ]
}

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